Determination of thermal reversible and irreversible effects during crystal irradiation at 4th generation synchrotrons

We want to determine, by means of single crystal X-ray nanodiffraction, the relative amount of reversible and irreversible changes taking place in the crystal lattice of a few different materials as a consequence of X-ray irradiation. The importance of lattice heating will be addressed and compared to numerical models, gaining knowledge about the lattice temperature evolution, lattice damage and on the possible routes for defect engineering.

本研究拟借助单晶X射线纳米衍射（single crystal X-ray nanodiffraction）技术，定量表征多种不同材料在X射线辐照作用下，其晶格内发生的可逆与不可逆变化的相对占比。本研究将探讨晶格热效应的重要性，并与数值模型开展对比分析，以深入掌握晶格温度演化规律、晶格损伤机制，以及缺陷工程的可行路径。