In-situ Dark Field X-Ray Microscopy Study of Dislocation-Grain Boundary Interaction in Metals
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下载链接：
https://doi.esrf.fr/10.15151/ESRF-ES-2125096092
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资源简介：
Most metals used in industrial applications are poly-crystalline, consisting of numerous individual crystals known as grains. The grain boundaries, which form the interfaces between adjacent grains, play a crucial role in determining the metal's mechanical properties by impeding plastic deformation, which involves the movement of linear crystalline defects called dislocations. Despite their significance, the interaction between grain boundary characteristics and dislocation motion remains poorly understood. After successfully using Dark-Field X-ray Microscopy for recording time resolved movies of deformation driven dislocation migration in mm-sized aluminium samples , we now propose to use DFXM to study the interaction between these two fundamental structures—dislocations and grain boundaries—in aluminium poly-crystalline samples.
提供机构：
Technical University of Denmark, DTU Physics, Fysikvej, building 311, 2800 Kgs. Lyngby Kongens Lyngby, 2800, Copenhagen, DK; Stanford University, Laboratory for Advanced Materials, McCullough Bldg, 476 Lomita Mall Ca, 94305 Stanford, Usa; Danish Technical University, Materials and Surface Engineering , Produktionstorvet, 425, 107, 2800 Kgs. Lyngby, 2800, Copenhagen, DK; Technical University of Denmark, Department of Mechanical Engineering, Produktionstorvet 425, 2800 Lyngby, Denmark; Technical University of Denmark, DTU Physics, Fysikvej 397, 2880 Kgs. Lyngby, Denmark; Technical University of Denmark, Department of Physics, DTU Physics, Building 307, 2800 Lyngby, Denmark; Technical University of Denmark, Department of Physics, DTU Physics Building 307, 2800, Lyngby, DK
创建时间：
2028-01-01
