Dataset for "Artifacts from manganese reduction in rock samples prepared by focused ion beam (FIB) slicing for X-ray microspectroscopy"

X-ray microspectroscopy data, corresponding to the research paper, published as: D. S. Macholdt et al.: Artifacts from manganese reduction in rock samples prepared by focused ion beam (FIB) slicing for X-ray microspectroscopy, Geosci. Instrumentation, Methods Data Syst., 8(1), 97–111, doi:10.5194/gi-8-97-2019, 2019. For specific data requests beyond the data deposited here, please contact the corresponding authors.

本数据集为X射线显微光谱（X-ray microspectroscopy）数据，对应已发表的研究论文：D. S. Macholdt 等：《用于X射线显微光谱检测的聚焦离子束（FIB）切片制备岩样中锰还原产生的伪影》，刊载于《Geosci. Instrumentation, Methods Data Syst.》，8(1)，97–111，DOI:10.5194/gi-8-97-2019，2019年。如需获取本数据集以外的特定数据，请联系通讯作者。