Strain mapping of ferroelectric thin fime via SXDM

we plan use Scanning x-ray diffraction microscopy to measure the strain, domain structure of ferroelectric BaTiO3 samples.本研究拟采用扫描X射线衍射显微镜（Scanning X-ray Diffraction Microscopy）对铁电钛酸钡（ferroelectric BaTiO3）样品的应变与畴结构进行测量。