16574
收藏DataCite Commons2023-04-21 更新2025-05-17 收录
下载链接：
http://esdcdoi.esac.esa.int/doi/html/data/astronomy/hst/16574.html
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资源简介：
Due to damage to the silicon lattice of the UVIS CCD chips over time comma the charge transfer efficiency (CTE) of the UVIS camera degrades comma impacting science and calibration observations. A way to slow the impact of CTE loss is by applying a pixel-based CTE correction. Such a correction requires an algorithm that can identify and locate traps that are responsible for charge loss. This program will locate and characterize these charge traps comma map their distribution across the CCD chips comma and monitor the trap population growth over time. Previous programsdoublePoint 12693 comma 13084 comma 13569 comma 14013 comma 14379 comma 14542 comma 14991 comma 15577 comma 15722 comma 16402
提供机构：
European Space Agency
创建时间：
2023-04-21
