IODP Expedition 367 X-ray fluorescence (XRF)

Elemental peak intensities in section halves were measured by an Avaatech X-ray fluorescence (XRF) Core Scanner postexpedition. Each measurement position may be measured at multiple XRF conditions in order to excite and measure specific ranges of elements (e.g., 10 kV and no filter for light elements). Peak intensity changes (concentrations not provided) are then used to help recognize and define major chemostratigraphic units without the need for destructive sampling. Data are presented in comma-delimited (CSV) files by section and by energy/instrumental conditions.科考航次后，采用Avaatech品牌X射线荧光（X-ray fluorescence, XRF）岩心扫描仪对岩心半段的元素峰强度开展测量。为激发并检测特定范围的元素（例如针对轻元素设置10 kV电压且不使用滤光片），每个测量点位可在多种XRF仪器条件下进行多次测量。随后利用峰强度变化（未提供元素浓度数据），可在无需破坏性取样的情况下，识别并划定主要化学地层单元。数据以逗号分隔值（comma-delimited, CSV）文件格式提供，按岩心段以及仪器能量/运行条件进行分类组织。