IODP Expedition 395 X-ray fluorescence (XRF)

Elemental peak intensities in section halves were measured by an Avaatech X-ray fluorescence (XRF) Core Scanner postexpedition. Each measurement position may be measured at multiple XRF conditions in order to excite and measure specific ranges of elements (e.g., 10 kV and no filter for light elements). Peak intensity changes (concentrations not provided) are then used to help recognize and define major chemostratigraphic units without the need for destructive sampling. Data are presented in comma-delimited (CSV) files by section and by energy/instrumental conditions.经航次后检测，采用Avaatech型X射线荧光（X-ray fluorescence, XRF）岩芯扫描仪对岩芯半段的元素峰强度进行了测定。为激发并检测特定范围的元素（例如针对轻元素采用10 kV电压且无滤光片的测试条件），可针对每个测量点位在多种XRF仪器参数下开展多次测量。后续可借助峰强度变化（未提供元素浓度数据）识别并界定主要的化学地层单元，无需进行破坏性采样。数据按照岩芯段以及测试能量/仪器条件进行分类，以逗号分隔值（Comma-Separated Values, CSV）文件格式提供。