Nanobeam 4D-STEM raw data of monolayer WS2-WSe2 lateral heterojunctions

The sample under investigation comprises a monolayer WS2-WSe2 lateral heterojunction featuring in-plane epitaxial interfaces. The datasets were acquired using an electron microscope pixel array detector (EMPAD) at Cornell University in 2016, with the following specifications: Magnification: 27.5 kx, Convergence angle: 1.2 mrad, C2 aperture size: 70, Spot size: 9. This dataset is from the same batch of datasets referenced in the paper by Han et al., Nano Letters 18, 3746-3751 (2018). Additionally, data from the same batch are also cited in the publication by Shi et al., npj Computational Materials 8, 114 (2022). Further details regarding the materials synthesis can be found in the paper by Xie et al., Science 359, 1131-1136 (2018).本研究中的样品为具备面内外延界面的单层WS₂-WSe₂横向异质结。本数据集于2016年在康奈尔大学（Cornell University）通过电子显微镜像素阵列探测器（electron microscope pixel array detector，EMPAD）采集，采集参数如下：放大倍率27.5千倍（kx）、会聚角1.2毫弧度（mrad）、C2光阑尺寸70、光斑尺寸9。本数据集与Han等人2018年发表于《Nano Letters》第18卷第3746-3751页的论文中引用的数据集同批次；此外，该同批次数据集还被Shi等人2022年发表于《npj Computational Materials》第8卷第114页的论文引用。有关该材料合成的更多细节，可参阅Xie等人2018年发表于《Science》第359卷第1131-1136页的研究论文。