Research data supporting "Reducing coercive field and improving endurance in ferroelectric epitaxial HZO thin films via novel interface layer approach"
收藏DataCite Commons2025-10-23 更新2026-01-12 收录
下载链接：
https://www.repository.cam.ac.uk/handle/1810/391285
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资源简介：
The dataset includes macroscopic electrical characterization of ferroelectric thin films and microscopic electrical characterization using piezo-response force microscopy, structural characterization using x-ray diffraction and transmission electron microscopy, stoichiometric analysis using rutherfod backscattering spectrometry, chemical analysis using x-ray photoelectron spectroscopy, and theoretical calculation using nudge elastic band calculations.
提供机构：
Apollo - University of Cambridge Repository
创建时间：
2025-10-21
