Mapping mechanical properties of various layered materials by x-ray speckle imaging
收藏DataCite Commons2021-04-15 更新2025-04-15 收录
下载链接：
https://doi.esrf.fr/10.15151/ESRF-ES-421137170
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资源简介：
By using a compression system with a tomographic setup (tomopress), one can assess the mechanical properties of a sample. Speckle Imaging allows to measure up to a hundredth of a pixel structural movement. By coupling these two technics, we aim to map in fine detail the inner mechanical properties of an aluminum, wood, and polymer sample.
提供机构：
European Synchrotron Radiation Facility
创建时间：
2021-04-15
