supporting data for "Top electrode and interfacial engineering for high-performance photovoltaics"

The supporting dataset of the thesis named "Top electrode and interfacial engineering for high-performance photovoltaics". The related data contains SEM, TEM, and AFM images which is conducted during the research experiment. The morphology of the device and materials can directly prove the related statements in the thesis. The surface morphology of the AgNP films before and after annealing is characterized by scanning electron microscopy (SEM, Hitachi S4800 FEG), transmission electron microscopy (TEM, Philips Tecnai G2 20 S-TWIN), and atomic force microscopy (AFM, NT-MDT NTEGRA, taping mode).

本数据集为题为《高性能光伏器件的顶电极与界面工程》的学术论文配套支撑数据集。本次收录的实验数据涵盖研究过程中采集的扫描电子显微镜（SEM）、透射电子显微镜（TEM）以及原子力显微镜（AFM）成像结果。器件与材料的形貌表征结果可直接佐证论文中的相关论述。本研究采用扫描电子显微镜（SEM，日立S4800场发射枪型）、透射电子显微镜（TEM，飞利浦Tecnai G2 20 S-TWIN）以及原子力显微镜（AFM，NT-MDT NTEGRA，轻敲模式）对退火前后的银纳米颗粒（AgNP）薄膜的表面形貌进行了表征。