Mapping the Rare Earth Magnetization profile in designed compositionally-graded GdCoFe ferrimagnetic alloy films for spintronic applications.

This experiment aims to map the local variations of Gd magnetization profile through the thickness of GdFeCo ferrimagnetic films with a deliberately designed Gd variation through the film thickness. Hard X-ray resonant dichroism and magnetic reflectivity (XRMR) at the Gd L3 edge (7.24 keV) will be used to map the Gd magnetization profile through the film thickness. Temperature dependent XRMR measurements through compensation, combined with SIMS and SQUID magnetometry, will enable us to understand the evolution of the global and local compensation behaviour. This approach offers a comprehensive understanding of magnetization behaviour arising from compositional non-uniformities and their influence on the evolution of ferrimagnetic compensation in RE:TM alloys for spintronics.

本实验旨在对厚度方向Gd组分经刻意设计呈现梯度变化的GdFeCo亚铁磁薄膜，测绘其厚度方向的Gd磁化分布局部变化。实验将采用Gd L3吸收边（7.24 keV）处的硬X射线共振二色性与磁反射（XRMR）技术，完成该薄膜厚度方向Gd磁化分布的测绘。结合二次离子质谱（SIMS, Secondary Ion Mass Spectrometry）与超导量子干涉仪磁强测量（SQUID magnetometry），对覆盖磁补偿过程的温度依赖型XRMR测量，将帮助我们阐明全局与局域磁补偿行为的演化规律。该方法可全面解析由组分不均匀性引发的磁化行为，及其对自旋电子学领域稀土-过渡金属（RE:TM, Rare Earth:Transition Metal）合金中铁磁补偿演化过程的影响。