MBE-obtained n-CdO:Eu/p-Si heterojunctions—electron beam–induced profiling, electrical and structural properties

Name: MBE-obtained n-CdO:Eu/p-Si heterojunctions—electron beam–induced profiling, electrical and structural properties
Creator: Institute of Physics, Polish Academy of Sciences
Published: 2026-02-23T08:02:41+08:00

RepOD Repository for Open Data2026-02-23 更新2026-07-23 收录

异质结电学性质

电子束诱导剖面分析

数据链接：

https://repod.icm.edu.pl/dataset.xhtml?persistentId=doi:10.18150/LIGCMW 数据链接链接失效反馈

官方服务：

资源简介：

Przeździecka, Ewa, 2026, "MBE-obtained n-CdO:Eu/p-Si heterojunctions—electron beam–induced profiling, electrical and structural properties", https://doi.org/10.18150/LIGCMW, RepOD, V1

提供机构：

Institute of Physics, Polish Academy of Sciences

创建时间：

2026-02-23