X-ray topography - TECHNO CLS diamond sample
收藏官方服务：
资源简介：
X-ray topography (Rocking Curve diffraction imaging) of a diamond sample with Boron doping profile in epilayers (sample 2c, 4 periods, period sinus 14 µm). project Techno CLS for crystal undulator.
创建时间：
2027-01-01
