Taylor658/photonic-integrated-circuit-yield

光子集成电路良品率数据集是一个包含12.5万条合成数据（良品率查询，良品率推理响应）对的数据集。该数据集旨在模拟光子集成电路制造中的技术挑战、工艺变化和良品率分析。每个条目包括一个详细的技术问题描述和一个包含定量良品率分析和定性过程建议的合成验证解释。该数据集仅供研究和实验使用，不代表实际的制造数据或提供可操作的制造建议。

The Photonic Integrated Circuit Yield Dataset is a synthetic dataset comprising 125,000 (yield query, yield reasoning response) pairs designed to simulate the realistic challenges in optical chip manufacturing. Each entry includes a detailed technical problem description and a synthetic verified explanation with quantitative yield analysis and qualitative process recommendations. The dataset is for research and experimentation purposes only and does not represent real manufacturing data or provide actionable manufacturing advice.