Beam Characterization of a 445 nm, 10 W Fiber-Coupled Diode Laser Using a NanoScan V2 Scanning-Slit Beam Profiler

This dataset contains spatial beam profile measurements acquired from a 445 nm fiber-coupled diode laser (BWT K445HMTFN-10.00WN1N) using a NanoScan V2 scanning-slit beam profiling system. Measurements were performed under controlled laboratory conditions to evaluate beam quality, beam diameter evolution, ellipticity, divergence characteristics, and thermal stability. Laser package temperature was monitored using the integrated NTC thermistor to investigate thermal influences on beam quality and pointing stability. The resulting dataset supports investigation of high-power blue diode laser sources for additive material processing and to facilitate optical-collimation to Gaussian-beam propagation analysis and optimisation.本数据集包含采用NanoScan V2扫描狭缝式光束轮廓仪（NanoScan V2 scanning-slit beam profiling system），对BWT K445HMTFN-10.00WN1N型445纳米光纤耦合二极管激光器采集得到的空间光束轮廓测量数据。本次测量于受控实验室环境下开展，旨在评估光束质量、光束直径演化特性、椭圆度、发散特性及热稳定性。研究人员借助集成的NTC热敏电阻（NTC thermistor）监测激光器封装温度，以探究热因素对光束质量与指向稳定性的影响。本数据集既可支撑高功率蓝色二极管激光源在增材制造领域的相关研究，也可辅助开展光学准直及高斯光束传播分析与优化工作。