Additional file 5 of Non-destructive, high-content analysis of wheat grain traits using X-ray micro computed tomography

Additional file 5: Table S3. Dataset used. Tables contain all the collected data for grain and spike parameters.附加文件5：表S3。本研究所用数据集即为此表，其涵盖了全部收集得到的籽粒与穗部参数相关数据。