IODP Expedition 390C X-ray fluorescence (XRF)

Elemental peak intensities in section halves were measured by an Avaatech X-ray fluorescence (XRF) Core Scanner post-expedition. Each measurement position may be measured at multiple XRF conditions in order to excite and measure specific ranges of elements (e.g., 10 kV and no filter for light elements). Peak intensity changes (concentrations not provided) are then used to help recognize and define major chemostratigraphic units without the need for destructive sampling. Data are presented in comma-delimited (CSV) files by section and by energy/instrumental conditions.科考结束后，采用Avaatech型X射线荧光（X-ray Fluorescence, XRF）岩芯扫描仪对岩芯半段的元素峰强度开展测量。为激发并测定特定范围的元素（例如针对轻元素采用10 kV电压且不使用滤光片），每个测量点位可在多种XRF工作条件下进行检测。随后将峰强度变化（未提供元素浓度数据）用于识别与划分主要化学地层单元，无需开展破坏性取样。数据按岩芯段以及能量/仪器工作条件分类，存储于逗号分隔值（Comma-Separated Values, CSV）文件中。