Imaging of ultrafast wavefront from compressed Ni Micro-pillars using Tele-ptychography.

High brilliant sources, IV generation synchrotrons and XFELs, open new capabilities to study materials with single high coherence shots. We want to extend our understanding of the dependence of the signal with dynamical diffraction in compressed microstructures of High Z materials. In this effort, we want to image a model sample such as 5 um Ni single crystal micro-pillars using nanofocus diffraction tele-ptychography in diffraction direction. This technique was successfully implemented in the forward direction at NanoMAX to study nano-indented Si wavers. The study of the dynamical diffraction echoes in Ni in the diffraction direction can only be performed in a beamline with the beam properties and detector geometry such as ID01. This dynamical diffraction effect shows a femtosecond time dependence that could be used to reconstruct ultrafast 3D maps of lattice oscillations in metals, semiconductors or other functional materials microstructures.