4D STEM dataset - DECTRIS ARINA detector - SmB6 sample

4D STEM dataset recorded with DECTRIS ARINA detector. Sample is a monocrystalline domain of SmB6 oriented along the &lt;110&gt; zone axis, prepared with FIB by Elisabeth Mueller at PSI. Data collection was with a probe-corrected 200kV TEM microscope, supported by Mingjian Wu at FAU. Further experimental parameters are listed with the included txt file. Data visualization and processing can be done with NOVENA software, freely available at DECTRIS website. Alternatively, the files can be opened using a HDF5 file reader.本数据集为采用DECTRIS ARINA探测器采集获得的四维扫描透射电子显微镜（4D Scanning Transmission Electron Microscopy，4D STEM）数据集。实验样品为六硼化钐（SmB₆）的单晶畴，沿<110>晶带轴取向，由瑞士保罗·谢勒研究所（Paul Scherrer Institute, PSI）的Elisabeth Mueller通过聚焦离子束（Focused Ion Beam, FIB）制备完成。数据采集通过球差校正型200千伏透射电子显微镜（Transmission Electron Microscopy, TEM）完成，该实验由德国埃尔朗根-纽伦堡大学（Friedrich-Alexander-Universität Erlangen-Nürnberg, FAU）的Mingjian Wu提供技术支持。详细的实验参数已列于配套的文本文件中。数据的可视化与处理可通过DECTRIS官网免费获取的NOVENA软件实现；相关文件亦可使用分层数据格式5（Hierarchical Data Format 5, HDF5）阅读器打开。