Surface Topography Challenge 2023 - Espinosa Group - Sample C55
收藏DataCite Commons2025-05-12 更新2025-06-14 收录
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资源简介：
Sample C55 (Smoother) - CrN deposited on polished side of silicon wafer. Topography data collected using profilometry, scanning electron microscopy, and atomic force microscopy in tapping (AC) mode, quantitative imaging (i.e. fast force mapping) mode, and contact mode.
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contact.engineering
创建时间：
2025-05-12
