Towards improved spin qubit quality: Low temperature determination of strain ...
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We aim to map the strain around spin CMOS compatible spin qubits at cryogenic temperature by Scanning Xray Diffraction Microscopy (SXDM). The qubits are housed in an epitaxial...
本研究旨在借助扫描X射线衍射显微镜（Scanning Xray Diffraction Microscopy，SXDM），对低温环境下兼容自旋CMOS的自旋量子比特（spin CMOS compatible spin qubits）周围的应变场进行测绘。该类量子比特被封装于外延结构中……
