X-ray data collection and refinement statistics.
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a Numbers in parenthesis are for the highest resolution shell.
b Rmerge = ∑hkl(∑i(|Ihkl,i-hkl>I))/∑hkl,ihkl>, where Ihkl,i is the intensity of an individual measurement of thereflection with Miller indices h, k and l, and is the mean intensity of that reflection. Calculated for I>-3σ (I).
c Rcryst = ∑hkl(||Fobshkl|-|Fcalchkl||)/|Fobshkl|, where |Fobshkl| and |Fcalchkl| are the observed and calculated structure factor amplitudes, respectively.
d Rfreeis equivalent to Rcryst but calculated with reflections (5%) omitted from the refinement.
e Calculated with Phenix [42].
f Calculated with MolProbity[43].
X-ray data collection and refinement statistics.
创建时间:
2015-07-20



