Statistical variability of neutron-induced soft errors in advanced Flash Memo...
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We propose to expose to neutrons a large number of NAND Flash memory samples, belonging to different technology nodes and vendors, in order to investigate the impact of...
本研究拟对大量来自不同工艺节点、不同厂商的NAND闪存（NAND Flash Memory）样品开展中子辐照实验，以探究……的影响
