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Molecular Dynamics Simulation Data: AlCoCuFeNi High-Entropy Alloy Thin Film Deposition on Silicon

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Zenodo2025-12-11 更新2026-05-26 收录
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This dataset provides the atomic structure trajectories (molecular dynamics snapshots) representing the growth of an AlCoCuFeNi high-entropy alloy thin film on a monocrystalline Silicon (100) substrate. Data Content:The dataset consists of LAMMPS dump files capturing the evolution of the atomic structure during the physical vapor deposition (PVD) process. These files allow researchers to perform independent structural analysis, including: Phase composition analysis (e.g., Common Neighbor Analysis - CNA). Radial Distribution Function (RDF) calculations for individual phases. Microstructural characterization (morphology of islands, grain boundaries, and segregation). Simulation Methodology:The data were generated using classical molecular dynamics (MD) simulations via the LAMMPS code. Deposition parameters: Atoms were deposited with a kinetic energy of 0.1 eV, corresponding to thermal evaporation conditions. Substrate: Si(100) kept at 300 K. Interatomic Potentials: Metal-Metal: EAM alloy potential described by Zhou et al. [Phys. Rev. B 69, 144113 (2004)]. Si-Si: Stillinger-Weber (SW) potential. Metal-Si: Lennard-Jones (LJ) potential. Atom Type Mapping:The dump files utilize numeric atom IDs. For proper visualization (e.g., in OVITO), use the following mapping: Type 1: Al (Aluminum) Type 2: Co (Cobalt) Type 3: Cu (Copper) Type 4: Fe (Iron) Type 5: Ni (Nickel) Type 6: Si (Silicon) Files included:Atomic structure trajectory (dump).Interatomic potential files (.eam.alloy, .sw) used for the simulation.

本数据集提供了表征AlCoCuFeNi高熵合金(high-entropy alloy)薄膜在单晶硅(100)衬底上生长的原子结构轨迹(分子动力学快照)。 数据内容:本数据集包含LAMMPS dump文件,记录了物理气相沉积(physical vapor deposition, PVD)过程中原子结构的演化历程。此类文件可供研究人员开展独立的结构分析,包括: 相组成分析(例如公共邻域分析(Common Neighbor Analysis, CNA)); 各相的径向分布函数(Radial Distribution Function, RDF)计算; 微观结构表征(岛状形貌、晶界及偏析行为分析)。 模拟方法:本数据通过LAMMPS软件开展经典分子动力学(classical molecular dynamics, MD)模拟生成。 沉积参数:原子沉积动能为0.1 eV,对应热蒸发沉积条件。 衬底:Si(100)衬底维持在300 K。 原子间相互作用势: 金属-金属相互作用:采用Zhou等人[Phys. Rev. B 69, 144113 (2004)]提出的嵌入原子法(Embedded Atom Method, EAM)合金势。 硅-硅相互作用:采用Stillinger-Weber(SW)势。 金属-硅相互作用:采用伦纳德-琼斯(Lennard-Jones, LJ)势。 原子类型映射:轨迹文件采用数值原子ID标识原子。若需进行可视化(例如在OVITO软件中),请使用如下映射规则: 类型1:铝(Aluminum, Al) 类型2:钴(Cobalt, Co) 类型3:铜(Copper, Cu) 类型4:铁(Iron, Fe) 类型5:镍(Nickel, Ni) 类型6:硅(Silicon, Si) 包含文件: 原子结构轨迹文件(dump格式); 模拟所用的原子间相互作用势文件(.eam.alloy、.sw格式)。

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2025-12-11
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