Crystal properties and data collection.

Data for the high resolution shell are shown in parentheses.†Rmerge = ΣhklΣi | Ii(hkl) − I(hkl)> |/ΣhklΣi Ii(hkl), where Ii(hkl) is the intensity of the ith measurement of an equivalent reflection with indices hkl.高分辨率壳层（high resolution shell）的数据标注于括号内。†Rmerge = ΣₕₖₗΣᵢ | Iᵢ(hkl) − ⟨I(hkl)⟩ | / ΣₕₖₗΣᵢ Iᵢ(hkl)，其中Iᵢ(hkl)为衍射指标为hkl的等价衍射的第i次测量强度。