Master 2 Practical : Investigation of Si bonding interfaces with X-ray reflectivity

The purpose of the experiment is to perform a practical with M2 students of the UGA. The topic of the practical will be the investigation of bonding interfaces in Si wafer using X-ray reflectivity.

本实验旨在面向UGA的M2（硕士二年级）学生开展实践教学活动。本次实践的主题为采用X射线反射率（X-ray reflectivity）技术研究硅晶圆（Silicon wafer）的键合界面。