Trace element maps of four zircon reference materials using LA-ICP-MS and FIB-SEM-based TOF-SIMS

This dataset provides high spatial resolution trace element maps of four zircon reference materials: 91500 (Ontario, Canada), Mud Tank (Northern Territory, Australia), Temora (New South Wales, Australia), and Plešovice (South Bohemia, Czech Republic), as well as zircon crystals from the Mount Dromedary/Gulaga Igneous Complex, New South Wales, Australia. Qualitative, sub-micrometre resolution focused ion beam scanning electron microscope (FIB-SEM) based time-of-flight secondary ion mass spectrometry (TOF-SIMS) isotope maps and associated spectra are presented. Five-micrometre resolution raster isotope maps created from laser ablation-inductively coupled-mass spectrometry line scans are also presented. These data are useful for assessing trace element variation at very fine scale in zircon reference materials and ‘unknown’ zircon crystals. The data also confirm the usefulness of TOF-SIMS in this novel application to zirconology.

本数据集涵盖四种锆石标准物质的高空间分辨率微量元素分布图，这四种标准物质分别为：产自加拿大安大略省的91500、澳大利亚北领地的Mud Tank、澳大利亚新南威尔士州的Temora，以及捷克共和国南波希米亚州的Plešovice；此外还包含采自澳大利亚新南威尔士州德罗姆达里山/古拉加火成杂岩的锆石晶体。本数据集同时提供基于聚焦离子束扫描电子显微镜（Focused Ion Beam Scanning Electron Microscope, FIB-SEM）的定性亚微米级分辨率飞行时间二次离子质谱（Time-of-Flight Secondary Ion Mass Spectrometry, TOF-SIMS）同位素分布图及配套谱图，以及由激光剥蚀-电感耦合等离子体质谱线扫数据生成的5微米分辨率栅格式同位素分布图。此类数据可用于精准评估锆石标准物质与"未知"锆石晶体在极细尺度下的微量元素变化特征，同时验证了TOF-SIMS在锆石学这一新兴应用场景中的实用性。