An Accuracy Assessment of the Surface Reflectance Product from the EMIT Imaging Spectrometer
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http://dataverse.jpl.nasa.gov/citation?persistentId=doi:10.48577/jpl.18EIZV
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An Accuracy Assessment of the Surface Reflectance Product from the EMIT Imaging Spectrometer
EMIT成像光谱仪(Imaging Spectrometer)所产出的地表反射率产品(Surface Reflectance Product)的精度评估
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Root
创建时间:
2024-11-06



