IODP Expedition 353 Color reflectance

Color reflectance data were measured on section halves using an integration sphere and a UV-VIS spectrophotometer mounted on the Section Half Multisensor Logger (SHMSL). Spectral counts are recorded in the range of 380 to 700 nm, covering the visible spectrum, and binned in ~2 nm bins. Spectral data are reduced from spectra and recorded in tristimulus XYZ values, CieLAB L*a*b* values, and other units.本数据集的颜色反射率数据通过搭载于半切片多传感器记录仪（Section Half Multisensor Logger, SHMSL）的积分球与紫外-可见（UV-VIS）分光光度计，对半切片样本完成测量。光谱计数的采集波段覆盖380至700纳米的全可见光谱范围，以约2纳米为间隔进行分箱存储。光谱数据经约简处理后，将以三刺激XYZ值、CIE L*a*b*颜色空间参数及其他单位格式进行记录。