Sb2S3_line1_EBSD_fastscan

Electron backscattered patterns for each point of an laser-fabricated Sb2S3 crystal in glass. Collected with TSLOIMElectron backscattered patterns for each point of a laser-fabricated Sb2S3 crystal in glass. Collected with TSL OIM Data Collection software on a Hitachi 4300 SE. Microscope was operated in variable pressure mode with 30 Pa using an accelerating voltage of 30 kV and a working distance of about 17 mm. Crystal was tilted 70° relative to the beam. X-, Y-coordinates are in 10 nm units.本数据集包含玻璃基体中激光制备的三硫化二锑（Sb₂S₃）晶体各测点的电子背散射花样（Electron backscattered patterns）。数据采用日立（Hitachi）4300 SE型显微镜搭载的TSL OIM数据采集软件（TSL OIM Data Collection Software）采集。实验过程中，显微镜工作于可变压力模式，压力为30 Pa，加速电压为30 kV，工作距离约17 mm。晶体相对于电子束倾斜70°。X、Y坐标以10 nm为单位。