Plant Pathology 2020 challenge dataset
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Plant Pathology 2020挑战数据集由康奈尔大学创建,包含3651张高质量的真实苹果叶片病害症状图像,涵盖多种光照、角度、表面和噪声条件。数据集通过专家标注,用于训练和测试卷积神经网络模型,以实现苹果叶片病害的自动分类。该数据集主要应用于农业领域,旨在通过机器学习技术实现快速准确的病害检测,以支持苹果园的病害管理。
The Plant Pathology 2020 Challenge Dataset, developed by Cornell University, consists of 3,651 high-quality real-world images depicting symptoms of apple leaf diseases. The dataset covers diverse scenarios including varying lighting conditions, shooting angles, leaf surface states and noise interference. It has been expertly annotated, and is specifically designed for training and testing convolutional neural network (CNN) models to enable automatic classification of apple leaf diseases. Primarily applied in the agricultural domain, this dataset aims to facilitate rapid and accurate disease detection through machine learning techniques, thereby supporting disease management in apple orchards.




