Fig 6b - FWHM vs distance - broken membrane
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The temperature profile on a broken patterned silicon membrane. (b) The line width versus the relative distance between the moving heating laser and the DBT-Ac nanocrystal. The error bars correspond to repeated laser scans, as explained in Sec. III A from the related publication. (c) The temperature profile as a function of the relative distance between the moving heating laser and the DBT-Ac nanocrystal. The red circles denote temperatures estimated from experimental measurements in (b) considering a calibration curve as described in Sec. III A. The solid lines represent simulated temperature profiles assuming different power laws of dependence of the thermal conductivity on the temperature, as well as the presence or lack thereof of the tear, as described in the text.
(a)图案化破损硅膜的温度分布。(b) 移动式加热激光与DBT-Ac纳米晶体(DBT-Ac nanocrystal)之间的相对距离与线宽的对应关系。误差棒代表重复激光扫描的结果,详见相关已发表文献的第III A小节。(c) 移动式加热激光与DBT-Ac纳米晶体之间的相对距离对应的温度分布。红色圆点表示依据(b)中的实验测量结果,并结合第III A小节所述的校准曲线估算得到的温度数值。实线代表模拟得到的温度分布,其假设了热导率随温度变化的不同幂律关系,同时考虑或不考虑结构撕裂的影响,具体如正文所述。



