IODP Expedition 401 X-ray fluorescence (XRF)

Elemental peak intensities in section halves were measured by an Avaatech X-ray fluorescence (XRF) Core Scanner postexpedition. Each measurement position may be measured at multiple XRF conditions in order to excite and measure specific ranges of elements (e.g., 10 kV and no filter for light elements). Peak intensity changes (concentrations not provided) are then used to help recognize and define major chemostratigraphic units without the need for destructive sampling. Data are presented in comma-delimited (CSV) files by section and by energy/instrumental conditions.科考返航后，使用Avaatech品牌X射线荧光（X-ray fluorescence, XRF）岩心扫描仪对岩心半块的元素峰强度开展测量。为激发并测定特定范围的元素（例如针对轻元素采用10 kV电压且不加滤光片），每个测量点位可在多种XRF测试条件下完成测量。随后借助峰强度变化（未提供元素浓度数据），可在无需破坏性取样的前提下识别并划分主要化学地层单元。数据按照岩心段以及测试能量/仪器条件，以逗号分隔值（comma-delimited, CSV）格式进行存储与呈现。