Mapping the Rare Earth Magnetization profile in designed compositionally-graded GdCoFe ferrimagnetic alloy films for spintronic applications.

This experiment aims to map the local variations of Gd magnetization profile through the thickness of GdFeCo ferrimagnetic films with a deliberately designed Gd variation through the film thickness. Hard X-ray resonant dichroism and magnetic reflectivity (XRMR) at the Gd L3 edge (7.24 keV) will be used to map the Gd magnetization profile through the film thickness. Temperature dependent XRMR measurements through compensation, combined with SIMS and SQUID magnetometry, will enable us to understand the evolution of the global and local compensation behaviour. This approach offers a comprehensive understanding of magnetization behaviour arising from compositional non-uniformities and their influence on the evolution of ferrimagnetic compensation in RE:TM alloys for spintronics.

本实验旨在通过在钆铁钴（GdFeCo）亚铁磁薄膜的厚度方向引入刻意设计的钆（Gadolinium, Gd）组分变化，测绘该薄膜厚度方向的钆磁化分布局域特征。将采用钆L3吸收边（7.24 keV）处的硬X射线共振磁二向色性与X射线磁性反射率（X-ray Magnetic Reflectivity, XRMR），表征薄膜厚度方向的钆磁化分布。结合穿过磁补偿点的变温XRMR测量、二次离子质谱（Secondary Ion Mass Spectrometry, SIMS）与超导量子干涉仪磁强计（SQUID magnetometry）的分析结果，本研究将阐明全局与局域磁补偿行为的演化规律。该方法可全面揭示由组分不均匀性引发的磁化行为，及其对自旋电子学领域稀土-过渡金属（RE:TM）合金中亚铁磁磁补偿演化的影响。