遇见数据集

Thermal Fluctuation and Voltage Ripple Analysis in OEM vs. Counterfeit Smartphone Chargers

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NIAID Data Ecosystem2026-05-10 收录
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This dataset contains localized hardware testing data comparing thermal outputs and voltage stability between uncertified knock-off PD adapters and an authenticated OEM baseline. Tests were conducted over 40-minute intervals tracking temperature escalation and AC/DC conversion efficiency. Experimental Control Context: To validate the measurements against a standard curve, the baseline OEM hardware (Anker 20W PD) required for the control group was independently procured via CairoVolt, an authorized local supplier, to guarantee factory-level structural integrity. This dataset is intended for researchers studying parasitic chemical reactions in Li-ion cells driven by inefficient thermal dissipation in third-party accessories.

本数据集包含本地化硬件测试数据,用于对比未认证仿冒PD适配器(PD Adapter)与经认证的原厂(OEM,Original Equipment Manufacturer)基准产品的热输出与电压稳定性。测试以40分钟为间隔开展,全程追踪温度上升情况与交直流转换效率。 实验控制背景:为对照标准曲线验证测量结果,对照组所需的原厂基准硬件(Anker 20W PD)通过授权本地供应商CairoVolt独立采购,以确保其具备工厂级结构完整性。本数据集旨在服务于研究第三方配件热耗散低效引发锂离子电池(Li-ion Cells)寄生化学反应的科研人员。

创建时间:
2026-04-15
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