PARPLE: Detailed automatized and parallel evaluation of luminescence mappings

This program has been imported from the CPC Program Library held at Queen's University Belfast (1969-2018) Abstract Laterally resolved luminescence techniques offer the possibility to examine thin film semiconductors with respect to the inhomogeneities of their opto-electronic, optical and chemical properties. Especially the integrated photoluminescence (PL) yield and splitting of quasi-Fermi levels (QFL) are of interest as well as the derived optical properties like the optical band gap, the Urbach energy and the absorption due to defect states within the band gap. For a large set of individual PL spectra... Title of program: PARPLE Catalogue Id: AEWJ_v1_0 Nature of problem Evaluation of PL spectra and extraction of opto-electronic properties including integrated PL yield, splitting of quasi-Fermi levels and optical band gap. The spectral shift of the PL spectra is covered by use of an adaptive fit procedure. Versions of this program held in the CPC repository in Mendeley Data AEWJ_v1_0; PARPLE; 10.1016/j.cpc.2015.03.017

本程序源自贝尔法斯特女王大学馆藏的CPC程序库（1969-2018年）。
摘要：横向分辨发光技术可用于表征薄膜半导体的光电子、光学及化学性质非均匀性。其中，积分光致发光（photoluminescence, PL）产率、准费米能级（quasi-Fermi levels, QFL）劈裂，以及由带隙内缺陷态引发的光学带隙、乌尔巴赫能量与吸收特性等衍生光学性质均为核心研究对象。针对大量独立的PL光谱……
程序名称：PARPLE
编目编号：AEWJ_v1_0
问题概述：对PL光谱进行分析并提取光电子性质，包括积分PL产率、准费米能级劈裂与光学带隙。本程序采用自适应拟合流程处理PL光谱的光谱偏移问题。
该程序在Mendeley数据平台CPC库中的版本信息：AEWJ_v1_0；PARPLE；10.1016/j.cpc.2015.03.017