PS-BBICS: Pulse Stretching Bulk Built-in Current Sensor for On-chip Measurement of Single Event Transients (raw data from journal article)

This upload contains raw data from the manuscript "PS-BBICS: Pulse Stretching Bulk Built-in Current Sensor for On-chip Measurement of Single Event Transients". The manuscript was published in Microelectronics Reliability, vol. 138, 2022.; DOI: https://doi.org/10.1016/j.microrel.2022.114726

The upload consists of .pdf file of the manuscript and .opj files with raw data related to the figures in the manuscript. 

This work was supported in part by the European Union’s Horizon 2020 research and innovation programme (Grant No. 857558).

本上传内容包含论文《PS-BBICS：用于单粒子瞬态片上测量的脉冲拉伸体内置电流传感器》的原始实验数据。该论文发表于《Microelectronics Reliability》2022年第138卷，DOI为https://doi.org/10.1016/j.microrel.2022.114726。

本次上传包含该论文的PDF文件，以及与论文中各图表相关的原始数据.opj文件。

本研究部分受到欧盟“地平线2020”研究与创新计划（项目编号：857558）的资助。