In-situ scanning gate imaging of individual two-level material defects in live superconducting quantum circuits

Data taken by scanning gate microscopy of two level systems defects in live superconducting circuits. https://arxiv.org/abs/2408.16660.

We acknowledge the project (23FUN08 MetSuperQ) which has received funding from the European Partnership on Metrology, co-financed from the European Union’s Horizon Europe Research and Innovation Programme and by the Participating States.

本数据集为通过扫描门显微镜（scanning gate microscopy）对有源超导电路内的双能级系统缺陷采集得到的数据。相关研究论文可参阅：https://arxiv.org/abs/2408.16660。

我们谨致谢由计量欧洲伙伴计划（European Partnership on Metrology）资助的项目（23FUN08 MetSuperQ），该计划由欧盟地平线欧洲研究与创新计划及各参与国共同出资。