Supplementary data and information for 'Electron-Beam-Induced Carbon Contamination in STEM-in-SEM: Quantification and Mitigation'

This repository contains supplementary data and information for the journal article "Electron-beam-induced carbon contamination in STEM-in-SEM: Quantification and mitigation" (https://doi.org/10.1093/micmic/ozac003). It provides comprehensive documentation of the thickness evaluation procedure based on STEM images. The thickness evaluation procedure is packed into a PYTHON library that can run using the provided exemplary images. It can also be adapted and applied to other images and individual settings, as described in the documentation file PythonTDL_Documentation.pdf. K. Adrion prepared the library based on the scripts written by her and M. Hugenschmidt, which were used for evaluating contamination thicknesses in the before-mentioned publication and on a conference poster: https://doi.org/10.5445/IR/1000135526.本仓库包含期刊论文《STEM-in-SEM中的电子束诱导碳污染：量化与抑制》（https://doi.org/10.1093/micmic/ozac003）的补充数据与相关资料。本仓库提供了基于扫描透射电子显微镜（Scanning Transmission Electron Microscope，STEM）图像的厚度评估流程的完整文档。该厚度评估流程已封装为Python库，可通过提供的示例图像直接运行。如文档文件PythonTDL_Documentation.pdf所述，该库也可经适配后应用于其他图像及个性化设置场景。K. Adrion基于她与M. Hugenschmidt共同撰写的脚本封装了该库，上述脚本曾用于前述期刊论文及一篇会议海报中的污染厚度评估工作：https://doi.org/10.5445/IR/1000135526。