Measures of fit and location (SE) of ARQ items.

Items are located in order of difficulty (from high AR to low AR). † degrees of freedom (620,4); *Bonferroni adjustment with a probability base of 0.01 (p = 0.005 for 20 items); note item 12 of borderline misfit. Included in the model because graphical fit was good and fit conceptual model.Measures of fit and location (SE) of ARQ items.所有项目按难度顺序排列（AR从高到低）。† 自由度为(620, 4)；* 邦费罗尼校正(Bonferroni adjustment)以0.01为基准概率（20个项目时对应的p值为0.005）；需注意第12项存在临界不拟合情况。因该项目的图形拟合效果良好且契合概念模型，故将其纳入模型。以下为ARQ项目的拟合度与位置参数（标准误(Standard Error)）。