X-ray photoelectron spectroscopic data for vapor deposited Celecoxib thin films and its irreversibly adsorbed material on substrate

1.    Raw data for the photoemission survey spectrum recorded for the neat Si substrate, the fresh vapor deposited Celecoxib layer on Si wafer, the irreversibly adsorbed CXB on Si substrate . Additionaly, raw data for the C1s, N1s and F1s core lines of the analyzed surface recorded at high energy resolution is included. 2.    Raw data of deconvoluted spectra of the C1s, N1s and F1s core lines obtained for all samples.For further information please consult readme file contained below.

1. 本数据集包含纯硅基底、硅片上新鲜气相沉积的塞来昔布（Celecoxib）层，以及不可逆吸附于硅基底的塞来昔布（简称CXB）的光电子能谱全谱（Photoemission Survey Spectrum）原始数据；此外还收录了所有分析表面在高能量分辨率下采集的C1s、N1s与F1s核心能级谱线原始数据。
2. 本数据集还包含所有样品的C1s、N1s、F1s核心能级谱线解卷积谱线原始数据。如需获取更多信息，请参阅下方包含的自述文件（readme）。