Data on degradation in scalable wide-bandgap perovskite solar cells
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This work investigates degradation pathways in scalable wide-bandgap (1.68 eV) perovskite solar cells by comparing their performance under standardized accelerated stress conditions with 1.61 eV reference devices. Stress testing following ISOS protocols includes continuous light (ISOS-L1), thermal storage (ISOS-D2), and combined light/heat exposure (ISOS-L2). Light-only stressing produced limited performance loss over tens of hours, whereas thermal and combined stresses caused faster efficiency decay. The study attributes key failure modes either to interface-related transport barriers or to absorber degradation under combined stresses, underscoring the need for diversified stability testing.
本研究通过对比带隙为1.68 eV的可规模化宽带隙(wide-bandgap)钙钛矿太阳能电池(perovskite solar cells)与带隙为1.61 eV的参比器件在标准化加速应力测试条件下的性能表现,探究其降解路径。本研究的加速应力测试遵循ISOS协议,涵盖连续光照(ISOS-L1)、热储存(ISOS-D2)以及光热联合暴露(ISOS-L2)三种测试方案。仅施加光照应力的测试在数十小时内仅造成有限的性能损失,而热应力与光热联合应力则会引发更快的效率衰减。本研究将主要失效模式归因于光热联合应力下的界面相关传输势垒或吸光层降解,凸显了开展多样化稳定性测试的必要性。



