Mapping the Rare Earth Magnetization profile in designed compositionally-graded GdCoFe ferrimagnetic alloy films for spintronic applications.

This experiment aims to map the local variations of Gd magnetization profile through the thickness of GdFeCo ferrimagnetic films with a deliberately designed Gd variation through the film thickness. Hard X-ray resonant dichroism and magnetic reflectivity (XRMR) at the Gd L3 edge (7.24 keV) will be used to map the Gd magnetization profile through the film thickness. Temperature dependent XRMR measurements through compensation, combined with SIMS and SQUID magnetometry, will enable us to understand the evolution of the global and local compensation behaviour. This approach offers a comprehensive understanding of magnetization behaviour arising from compositional non-uniformities and their influence on the evolution of ferrimagnetic compensation in RE:TM alloys for spintronics.

本实验旨在对GdFeCo亚铁磁薄膜厚度方向的钆（Gd）磁化分布局部变化进行精准测绘，该薄膜的厚度方向被刻意设计为引入钆组分的梯度变化。我们将采用Gd L3吸收边（7.24 keV）处的硬X射线共振磁二向色性与磁反射（XRMR）技术，完成该薄膜厚度方向钆磁化分布的图谱绘制。结合针对磁补偿点的温度依赖型XRMR测量，并辅以二次离子质谱（SIMS）与超导量子干涉仪（SQUID）磁强计量测，我们将得以阐明全局与局部磁补偿行为的演化规律。本研究方法可全面揭示由组分不均匀性引发的磁化行为，以及此类不均匀性对自旋电子学领域稀土-过渡金属（RE:TM）合金中亚铁磁补偿演化过程的影响。