Effect of Er- and Yb doping on structure, optical and electrical properties ZnO thin films

This dataset shows the effect of rare-earth (Er and Yb) doping and co-doping of ZnO thin films deposited using a sol-gel spin coating technique, as well as the temperature dependence of the electrical properties of the Schottky diodes based on these films that were investigated. The data consist of results of XRD, Raman spectroscopy, UV-Vis spectroscopy, I-V & C-V measurements, DLTS and Laplace-DLTS measurements for undoped, Er-doped, Yb-doped and (Er, Yb) co-doped ZnO thin films.

本数据集展示了采用溶胶-凝胶旋涂技术制备的氧化锌（ZnO）薄膜的稀土（铒Er与镱Yb）单掺杂与共掺杂效应，以及基于此类薄膜制备的肖特基（Schottky）二极管电学特性的温度依赖性研究结果。数据集包含未掺杂、Er掺杂、Yb掺杂以及（Er,Yb）共掺杂ZnO薄膜的X射线衍射（XRD）、拉曼光谱（Raman spectroscopy）、紫外-可见（UV-Vis）光谱、电流-电压（I-V）与电容-电压（C-V）测量数据，以及深能级瞬态谱（DLTS）和拉普拉斯深能级瞬态谱（Laplace-DLTS）的测试结果。