SEM micrographs of Ti tooth implant corrosion

The dataset contains micrographs made with a scanning electron microscope (SEM) Hitachi S-3400N of the tooth implant removed after inflammation. The inflammation was induced by the increased corrosion rate of the titanium screw. The reason for the corrosion to occur was the appearance of the concentration cell of different aeration for various areas of the screw. The more aerated area was a cathode, while the less aerated area was an anode.

本数据集包含采用日立S-3400N型扫描电子显微镜（scanning electron microscope，SEM）拍摄的炎症后取出的牙种植体显微图像。该炎症由钛螺钉腐蚀速率加快所诱发，而腐蚀发生的根源在于种植体螺钉各区域通气条件存在差异，进而形成了浓差电池（concentration cell）。其中，通气条件更优的区域为阴极（cathode），通气条件较差的区域则为阳极（anode）。