Potato Gene Expression Associated with the RB-mediated Broad-Spectrum late blight resistance

Late blight, caused by the oomycete Phytophthora infestans, is one of the most damaging potato diseases. Genetic resistance is one of the most effective means to control the destruction caused by this pathogen. Transgenic potato lines harboring a resistance gene, RB, confer broad-spectrum, rate-reducing late blight resistance. A microarray approach was used to understand what genes are manipulated in the potato background after the addition of the RB gene that contribute to the late blight resistant phenotype. Keywords: Time course, disease state analysis CRD (3x2x2) Split-Split Plot: 3 sampling time points after inoculation (2, 5, 10 hours), Two genotypes (Katahdin with and without the RB gene), Inoculation with P. infestans or mock inoculation with water. 48 arrays were hybridized in total; 12 in each biological replicate. Each genotype with the mock and late blight inoculated samples was hybridized on two arrays using a dye-swap procedure. Each genotype had a total of 6 arrays across the three sampling time points.

晚疫病（Late blight）由疫霉（oomycete *Phytophthora infestans*）引发，是对马铃薯危害最严重的病害之一。遗传抗性是防控该病原菌引发病害损失的最有效手段之一。携带有抗性基因RB的转基因马铃薯株系，可赋予植株广谱且能延缓病害发展速率的晚疫病抗性。本研究采用微阵列（microarray）技术，旨在解析转入RB基因后，马铃薯遗传背景中哪些基因的表达受到调控，进而参与形成晚疫病抗性表型。
关键词：时间进程（Time course）、病害状态分析；实验设计为3×2×2裂裂区完全随机设计（CRD, Split-Split Plot）：设置3个接种后取样时间点（2、5、10小时）、2种基因型（携带与不携带RB基因的卡塔丁（Katahdin））、2种接种处理（接种疫霉*P. infestans*或清水模拟接种）。总计完成48张微阵列芯片的杂交实验；每个生物学重复包含12张芯片。针对每种基因型的模拟接种与晚疫病接种样本，均通过染料互换（dye-swap）程序在2张芯片上完成杂交。在3个取样时间点下，每种基因型总计对应6张芯片。