Dataset on Dumpsite Minerallogical Transformation in Basement Terrains

The data used for this study are soil samples obtained both from within and outside the waste dump site. Five pits were dug to a total depth of 1.5m in all for collecting soil samples for analysis. Three pits (PF1-3) were selected within the dumpsite and two control-sites (BH1-2) at a distance of 100m away up and down stream of the dumpsite. Four samples were taken from each of the pits at depth intervals of 0.0m, 0.5m, 1.0m and 1.5m respectively. The 0.0m sample represented the surface sample while the 0.5m, 1.0m and 1.5m samples represented the intermediate and subsurface samples respectively. Mineralogical characterization were carried out using arrays of qualitative and quantitative X-ray diffraction (XRD) and Scanning electron microscopy (SEM) techniques. The effect of existing dumpsite on the mineralogical changes of nearby soils was evaluated with the use of arrays of qualitative and quantitative X-ray diffraction (XRD) and Scanning Electron Microscopy (SEM) techniques respectively. The morphology and the in situ chemical composition of some samples from the waste dump and natural areas were observed and determined using a Philips XLS-30 SEM. Scanning electron microscopy (SEM) was also performed to identify and understand the distribution of secondary mineral phases present at the soil and waste dump profiles.

本研究采用的土壤样品采集自垃圾填埋场场内及场外区域。本次研究共开挖5个总深度达1.5m的坑槽，用于采集土壤样品开展分析：其中3个坑槽（PF1-PF3）设置于填埋场场内，另外2个对照点位（BH1-BH2）位于填埋场上下游100m处的区域。每个坑槽分别按0.0m、0.5m、1.0m和1.5m的深度间隔采集4份土壤样品，其中0.0m深度的样品为表层土样，0.5m、1.0m及1.5m深度的样品分别代表中层与下层土样。本研究通过一系列定性与定量X射线衍射（X-ray diffraction, XRD）、扫描电子显微镜（Scanning Electron Microscopy, SEM）技术开展矿物学表征工作；分别采用上述两类技术，评估了现有垃圾填埋场对周边土壤矿物学特征变化的影响。研究利用Philips XLS-30型扫描电子显微镜，观察并测定了垃圾填埋场及自然区域部分样品的形貌与原位化学成分；此外还通过扫描电子显微镜（SEM）分析，识别并解析了土壤及垃圾填埋场剖面中次生矿物相的分布特征。