XPS, HAXPES, XRD and SEM datasets of functionalized graphene nanoplateletes

The datasets from (Hard Energy) X-ray photoelectron spectroscopy, X-ray diffraction and Scanning Electron Microsopy are related to the publication G. Chemello, X. Knigge, D. Ciornii, B.P. Reed, A.J. Pollard, C.A. Clifford, T. Howe, N. Vyas, V.-D. Hodoroaba, J. Radnik "Influence of the morphology on the functionalization of graphene nanoplatelets analyzed by comparative photoelectron spectroscopy with soft and hard X-rays" <em>Advanced Materials Interfaces </em>(2023), DOI: 10.1002/admi.202300116. Details of the materials and the experimental procedures are described in this publications. The filenames contain the material (g5 or g6), functionalization (Fluorine -f, Oxygen _o and raw material _raw), methods (XPS/HAXPES survey or high resolution, XRD, SEM). For the fitted spectra the peak is given: c1s, o1s, f1s. The data are given as tif-files for SEM (*tif). as asc ii files for XRD (*.xy) and the fitted XPS/HAXPES-spectra (*.dat) and as vamas data files for the XPS/HAXPES raw-data (*.npl).本数据集涵盖硬X射线光电子能谱（Hard Energy X-ray photoelectron spectroscopy, HAXPES）、X射线衍射（X-ray diffraction, XRD）及扫描电子显微镜（Scanning Electron Microscopy, SEM）的测试数据，关联发表论文为G. Chemello、X. Knigge、D. Ciornii、B.P. Reed、A.J. Pollard、C.A. Clifford、T. Howe、N. Vyas、V.-D. Hodoroaba、J. Radnik于2023年发表于*Advanced Materials Interfaces*的研究论文《Influence of the morphology on the functionalization of graphene nanoplatelets analyzed by comparative photoelectron spectroscopy with soft and hard X-rays》，DOI：10.1002/admi.202300116。实验所用材料与具体实验流程已在该论文中详细阐述。数据集文件名包含三类核心信息：样品标识（g5或g6）、功能化修饰类型（氟修饰_f、氧修饰_o及原始样品_raw）、测试方法（X射线光电子能谱/硬X射线光电子能谱全谱或高分辨谱、X射线衍射、扫描电子显微镜）。针对拟合后的能谱数据，文件名还标注了对应特征峰：c1s、o1s、f1s。不同测试类型的数据采用对应格式存储：扫描电子显微镜图像为tif格式文件（*.tif）；X射线衍射数据为ASCII格式文件（*.xy）；X射线光电子能谱/硬X射线光电子能谱的拟合谱以*.dat格式存储；该类测试的原始数据则采用VAMAS格式文件（*.npl）存储。