Q78 raw data

Atomic Force Microscopy (AFM) topographic images of sample Q78 (raw data). Images were acquired in dynamic mode. We used Nanosensors PPP-FM silicon probes with a spring constant of 3 N/m, resonance frequency of 75 kHz and a tip radius of about 10 nm. Images were acquired with a free oscillation of about 30 nm and an amplitude reduction set point of 25% of the free amplitude. All samples were simply cleaned with a gentle stream of N2 gas.

样品Q78的原子力显微镜（Atomic Force Microscopy, AFM）形貌原始图像。图像采用动态模式采集，所用探针为Nanosensors品牌PPP-FM型硅质探针，其弹性常数为3 N/m，共振频率为75 kHz，针尖半径约为10 nm。图像采集时的自由振荡幅度约为30 nm，振幅衰减设定点为自由振幅的25%。所有样品仅通过温和的氮气气流进行清洁。